Provides a flexible, more cost-effective compact platform for optical test switching and signal conditioning in optical device and sub-system development and manufacturing.
Optical test and measurement platform optimized for cost-effective development and manufacturing of optical transmission network elements.
Based on the previous-generation Multiple Application Platform (MAP), the MAP-200 builds on the differentiation of offering the broadest portfolio of modules in the densest and most configurable platform. The MAP-200 is optimized for test applications in lab and manufacturing environments ranging from insertion loss testing to dispersion penalty testing.
Available modules include broadband source, EDFA, Fabry-Perot laser, LED source, polarization controller, etc. For a full list, visit the related products tab.