Benefits

• Reduces test station rack space by up to 4x, reducing overhead costs associated w/ floor space, shipping and maintenance
• Reduces chassis costs by up to 40% easing transition to MAP as you retool to enable testing of higher performance optical devices and subsystems
• Flexible test configurations such as front or rear test access and vertical or horizontal chassis orientation enable test setups to match customer test stand specific needs
• Ease of expanding existing setups w/ backward compatible software to SB & SC switches and legacy signal conditioning solutions via GPIB or Ethernet

Applications

• Lab research & development of active optical devices (e.g. transponders, amplifiers, line cards)
• Manufacturing of active optical devices
• General purpose optical test switching (e.g. passive or active optical device work)

Key Features

• Two-slot chassis
• Hi-visibility touch-screen interface GUI
• Backward compatible to legacy SB & SC switches
• Front or rear test access to optical interfaces
• Horizontal or vertical chassis placement on bench or in rack
• Interfaces include GPIB, RJ45 Ethernet
• Pop-up front and rear feet w/ bumpers for stacking

Based on the previous-generation Multiple Application Platform (MAP), the MAP-200 builds on the differentiation of offering the broadest portfolio of modules in the densest and most configurable platform. The MAP-200 is optimized for test applications in lab and manufacturing environments ranging from insertion loss testing to dispersion penalty testing.

Available modules include broadband source, EDFA, Fabry-Perot laser, LED source, polarization controller, etc. For a full list, visit the related products tab.​