Benefits

• Reduces test station rack space by up to 4x, reducing overhead costs associated w/ floor space, shipping and maintenance
• Reduces chassis costs by up to 40% easing transition to MAP as you retool to enable testing of higher performance optical devices and subsystems
• Flexible test configurations such as front or rear test access and vertical or horizontal chassis orientation enable test setups to match customer test stand specific needs
• Ease of expanding existing setups w/ backward compatible software to SB & SC switches and legacy signal conditioning solutions via GPIB or Ethernet

Applications

• Lab research & development of active optical devices (e.g. transponders, amplifiers, line cards)
• Manufacturing of active optical devices
• General purpose optical test switching (e.g. passive or active optical device work)

Key Features

• Two-slot chassis
• Hi-visibility touch-screen interface GUI
• Backward compatible to legacy SB & SC switches
• Front or rear test access to optical interfaces
• Horizontal or vertical chassis placement on bench or in rack
• Interfaces include GPIB, RJ45 Ethernet
• Pop-up front and rear feet w/ bumpers for stacking

The new MAP-300 builds upon the proven strengths of the MAP System while adding innovation where it matters most for our customers. Backwards compatible support for the installed automation base, combined with several new features, including an HTML-based GUI for multi-user environments, gives customers the capabilities they need to achieve their goals. We can’t wait to see what you will accomplish with the new MAP-300!